-........... 0.15
"0.15
a A75 0.1
SA- 0.05
0
-0.05
A r ilk
-0.15
Figure 6-56. Normalized AT image for Series A specimens (t = 60 sec, long-pulse
heating)
Defect-free areas
One defect-free area was identified on each Series A specimen (labeled DF-1, DF-
2, DF-3, and DF-4 in Figure 6-57). The term "defect-free" is used to describe these areas
only because there were no implanted defects inside the areas or in the immediate
vicinity. Careful inspection of each area, however, did reveal small unintentional defects.
The average value of ATnorm was computed for each area at each time step (NP = total
number of pixels inside the area). Outlier pixels due to unintentional defects were
removed at each time step. The criterion for discarding a pixel was +/- 2.5 standard
deviations away from the mean value. The standard deviation was recomputed after each
outlier was removed. After the outlier pixels were removed, the modified mean and
standard deviation were computed for each area at each time step. The mean was plotted
for each area along with error bars representing +/- 2 a (Figure 6-58).
The single-layer specimen (A-1) produced similar results to the two points shown
in Figure 6-54B: ATnorm stays close to zero up to t1/2 = 2 and then decreases as the thermal