in Chapters 4 and 5. They are 1) selected area

diffraction (SAD), 2) Riecke method C-2 aperture limited

microdiffraction, 3) convergent beam diffraction, and 4)

convergent beam microdiffraction.

 If the sample area selected by the selected area

aperture was reasonably strain free, that is, free of

buckling and bending, then the selected area diffraction

mode was used to generate large area diffraction

patterns. The area defined by the aperture was minimally

3 square microns. If this method could not be used

because of buckling and bending, the Riecke method

(Warren, 1979) was used. The area defined by this method

is much smaller than that defined by the selected area

method, about 0.6 square microns. This area is too small

to be representative of the sample as a whole. The above

two methods produce diffraction patterns that are similar

in appearance and application. They both produce fine

diffraction spots in the diffraction patterns and are thus

amenable to the detection of subtle scattering effects.

 Convergent beam diffraction is a spatially localized

diffraction method. Only hundreds of square Angstroms are

analyzed. The diffraction pattern consists of large discs

rather than diffraction spots. Subtle diffraction effects

are usually masked by the elastic intensity distributions

in these discs. The elastic information in the discs